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MEMSnet Home: MEMS-Talk: Surface Measurment of "Black Silicon"
Surface Measurment of "Black Silicon"
2004-12-06
Jens Tuchscheerer
2004-12-16
Jens Tuchscheerer
Surface Measurment of "Black Silicon"
Jens Tuchscheerer
2004-12-06
Dear Group,
How can I measure the surface of  "Black Silicon" It is made by a
SF6/CF4 process
with a ICP etcher. The "Black Silicon" is formed by spikes (250nm thick
and 5µm high)
Yours sincerely
Jens Tuchscheerer

--

Jens Tuchscheerer
CLONDIAG chip technologies GmbH
Loebstedterstr. 103-105
07749 Jena
Tel.: +49 3641 59470
Fax.: +49 3641 594720
Mail: [email protected]
Web: www.clondiag.com

begin:vcard
fn:Jens Tuchscheerer
n:Tuchscheerer;Jens
org:CLONDIAG chip technologies GmbH
adr;quoted-printable;quoted-printable:;;L=C3=B6bstedterstr.
103-105;Jena;Th=C3=BCringen;07749;Germany
email;internet:[email protected]
tel;work:+49-3641-494725
tel;fax:+49-3641-494720
x-mozilla-html:TRUE
url:http://www.clondiag.com
version:2.1
end:vcard


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