I'm interested in measures using a WCT-100 Silicon-Wafer Lifetime
 Tester, for characterize surface recombination velocity, emitter and
 bulk minority-carrier lifetime in solar cells processing.
 I'll be very glad for any help about preparing the samples and
 techniques to perform the measures.

 Thanks.


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   Universidade de Sao Paulo
   Escola Politecnica
   Departamento de Engenharia Eletrônica
   Laboratório de Microeletrônica - Sala C2-70

   Av. Prof. Luciano Gualberto, travessa 3, N°158
   CEP 05424-970, CP 61548
   São Paulo/SP/Brazil

   Tel: (+55 11) 818-5256 Fax: (+55 11) 818-5585
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